<u id="szq0g"></u>

<u id="szq0g"></u>
  • <i id="szq0g"><bdo id="szq0g"></bdo></i>
    <i id="szq0g"></i>

    <u id="szq0g"></u>
  • <i id="szq0g"></i>
  • <u id="szq0g"></u>
  • Products Series

    Contacts


    Phone:0755-23158752
    Fax:0755-23763184
    Mobile:15814461886
    E-mail:speedre@qq.com
    Q Q:931514164
    Address:601, NO.1 building, hesheng Industrial Zone, hebei industrial park,Longhua New District, Shenzhen

    Coating thickness gaugeHome > Products > Coating thickness gauge

    SDR8102 Coating Thickness Gauge

      SDR8102 Coating Thickness Gauge

    • Price:0
    • Stock:10000
    • PDF Download:

    Product description:

    This device is a portable meter. It is capable of measuring coating thicknessquickly, precisely and without injury, both for the laboratory and engineeringenvironment. It is currently widely use

     

    The device use both Magnetic Method to measure the non-magnetic coating on amagnetic metal substrate and Eddy Current Method to measure the non-conductivecoating on a non-magnetic metal substrate.

     

    Magnetic Method(F-type probe)

    When the probe contacts thecover layer, the probe and magnetic substrate forms a closed magnetic circuit;Due to the presence of non-magnetic coating, magnetic resistance changes. Thethickness of the cover layer can be derived by measuring the change.

    Eddy Current Method (NF-type probe)

    When the probecontacts the cover layer, the probe and non-magnetic substrate forms EddyCurrent and gives feedback to the coil inside the probe.

    Thethickness of the cover layer can be derived by measuring the feedback.

     

    Features

    1.Thickness measurement using both Magnetic Method to measure the non-magneticcoating on a magnetic metal substrate and Eddy Current Method to measure thenon-conductive coating on a non-magnetic metal substrate.

    2.Single-point or two-point method could be used to correct probe systemdeviation, in order to ensure the accuracy of the device in the process ofmeasuring.

    3.Automatic identify ferrous and non-ferrous substrate quickly.

    4.Power voltage indicator.

    5.Speaker beep while operating.

    6.Power-off automatically when idle; manually power-off available.

    7.Negative display function to ensure the accuracy of zero point calibration.


    Technical Data

    Model

    SDR8102

    Principle

    Magnetic Method (F-type probe)& Eddy Current Method (NF-type probe)

    Range

    0-1250um

    Accuracy error

    zero calibration ± (1 + 3% H);

    two-point calibration ± [(1% ~ 3% H)] H + 1.5

    Power

    2 * AA battery

    Unit

    Um/mil

    Temperature

    0-40

    humidity

    ≤85%

    Minimumsubstrate

    10 * 10mm

    Minimum curvature

    5mm convex; 5mm concave

    Thinnest substrate

    0.4mm

    Weight

    99g

    Size

    102mm* 66mm*24mm

     

    Item Checklist

    Name

    Quantity

    Meter device

    1

    Standard films

    5

    Base substrate

    2

    5 dry cell

    2

    Packing box

    1

    User Manual

    1

     

    Prev:SDR821F Coating Thickness Gauge
    Next:No record
    亚洲欧美综合国产精品二区_强奸乱码中文字码_大胆欧美A级视频_思思热在线视频96